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Quality Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective factory
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Quality Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective factory
Quality Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective factory
>

Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective

Brand Name: SineImage
Model Number: COLOR CAMERA GRAY SCALE TEST CHART
Place of Origin: Beijing, China
Certification: CE&RoHS&TUV&FCC&ISO9001
Minimum Order Quantity: 1pc
Supply Ability: 1000pcs/month

Product Details


Brand: SineImage Model: TE275D
Light Source: Can Be Equipment Standard Light Source Modulation: Between 0.55 And 0.65
Aspect Ratio: 4:3 Measured Density: 0-1.67
Highlight

camera resolution chart

,

camera lens test chart

Product Description

Silk ISO 12233 SLANTED EDGE CHART REFLECTIVE Camera Test Chart Professional

The TE275 is designed to measure the resolution of still cameras using slanted edges.This chart is specified in the revision of the ISO standard 12233, published in February 2014.

 

Next to the TE268 and TE253 (sinusoidal Siemens stars) and the TE252 (visual appraisal of resolution) the slanted edges are the third pattern described in the ISO 12233 standard for resolution measurement.

 

The chart contains nine slanted edge structures, each with two vertical and two horizontal edges and a focussing aid in the center. The slanted edge structure is tilted by 5° and has a low contrast as required by the ISO 12233:2014 (modulation between 0.55 and 0.65). The backgrond provides a remission between 0.15 and 0.25 according to ISO12233:2014.

 

The slanted edges are arranged in a way, to deliver on axis information, information at 50% field position (4:3 aspect ratio) and at 70% field position.

Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 0

Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 1

Three black points can be used for automated detection of the target. This asymmetric arranged structure also helps to check and correct the orientation of the target.

 

The chart can be used for 4:3 or 3:2 aspect ratio using the framing lines and arrows.

 

The reflectances and arrangement of the 16 OECF patches is conform to the ISO 14524. With the analysis of theses patches the OECF can be determined and the image data linearized.

 

Densities of the OECF patches, background and slanted edge pattern:

 

Step

Measured

Density

1 1.67
2 1.47
3 0.20
4 0.28
5 0.35
6 0.44
7 0.51
8 0.61
9 0.71
10 0.82
11 0.93
12 1.07
13 1.17
14 1.33
15 1.46
16 1.67
Slanted Edge 1.33
Background 0.70


Related Products:

 

Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 2Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 3Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 4Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 5

About Us:

Nine Slanted Edge Structure Resolution Test Chart Silk Iso 12233 Slanted Edge Reflective 6

Contact Information:

 

Contact Person: Clara Liu;

Email: L001@Silk.com;

Wechat & Whatsapp ID: +8613510310267;

Skype: clara.Silk

 

Product Highlights

Silk ISO 12233 SLANTED EDGE CHART REFLECTIVE Camera Test Chart Professional The TE275 is designed to measure the resolution of still cameras using slanted edges.This chart is specified in the revision of the ISO standard 12233, published in February 2014. Next to the TE268 and TE253 (sinusoidal ...

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