780nm Portable Desktop Color Matching Spectrophotometer Silk TS8260
Product Details
| Optical Geometry: | D/8 | Wavelength: | 360-780nm |
|---|---|---|---|
| Repeatibility: | DeltaE ≤ 0.03 | Inter-instrument Error: | DeltaE ≤ 0.15 |
| Aperture: | 25.4mm & 15mm & 8mm & 4mm | Sphere Size: | Φ154mm |
| Highlight |
Portable Desktop Color Matching Spectrophotometer,780nm Desktop Color Matching Spectrophotometer,FCC Spraying Industry Spectrophotometer |
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Product Description
| Model | TS8280 |
| Optical Geometry | D/8(diffused illumination, 8-degree viewing angle) |
| SCI (specular component included)/SCE (specular component excluded) ; Include UV / excluded UV light source | |
| Comply to CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | |
| Characteristic | Φ30mm apertures, to adapt to the measurement of large sample; |
| Rotary press type structure, more convenient for testing; | |
| Accurate measurement, can be used for laboratory color accurate analysis and transmission; | |
| Suitable for precise color measurement and quality control in textile and garment printing and dyeing, plastic electronics, ceramics and other industries; It can be used for fluorescence sample measurement. | |
| Integrating Sphere Size | Φ152mm |
| Light Source | Combined full spectrum LED light source, UV light source |
| Spectrophotometric Mode | Flat Grating |
| Senso | Silicon photodiode array (double row 40 groups) |
| Wavelength Range | 400~700nm |
| Wavelength Interval | 10nm |
| Semiband Width | 10nm |
| Measured Reflectance Range | 0~200% |
| Measuring Aperture | Φ30mm/Φ25.4mm |
| Specular Component | SCI/SCE |
| Color Space | CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,HunterLab,βxy,DIN Lab99 Munsell(C/2) |
| Color Difference Formula | ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00, DINΔE99,ΔE(Hunter) |
| Other Colorimetric Index | WI(ASTM E313,CIE/ISO,AATCC,Hunter), |
| YI(ASTM D1925,ASTM 313), | |
| Metamerism Index MI, | |
| Staining Fastness, Color Fastness, Color Strength, Opacity | |
| 8° Glossiness,555 tone classification | |
| Observer Angle | 2°/10° |
| Illuminant | D65,A,C,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30) |
| Displayed Data | Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Simulation, Color Offset |
| Measuring Time | About 1.5s (Measure SCI & SCE about 3.2s) |
| Repeatability | Chromaticity value: MAV/SCI, within ΔE*ab 0.05 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration) |
| Inter-instrument Error | MAV/SCI, Within ΔE*ab 0.15 (Average for 12 BCRA Series II color tiles) |
| Measurement Mode | Single Measurement, Average Measurement(2-99times) |
| Locating Method | Camera Locating |
| Dimension | L*W*H=370X240X260mm |
| Weight | About 7.8kg |
| Battery | AC 24V, 3A Power adapter power supply |
| Illuminant Life Span | 5 years, more than 3 million times measurements |
| Display | 7-inch TFT color LCD, Capacitive Touch Screen |
| Data Port | USB, Bluetooth ®5.0, trigger switch interface |
| Data Storage | Standard 1000 Pcs, Sample 30000 Pcs |
| Language | Simplified Chinese, English, Traditional Chinese |
| Operating Environment | 0~40℃, 0~85%RH (no condensing), Altitude < 2000m |
| Storage Environment | -20~50℃, 0~85%RH (no condensing) |
| Standard Accessory | Power Adapter, USB Cable, User Guide, PC Software(Download from office website), White and Black Calibration Cavity,Aperture |
| Optional Accessory | Micro Printer, Foot Switch, Rotating Bracket |
| Notes | Technical parameters are only for reference, subject to the actual sale of the product |
Silk passed ISO 9001, CE, ROHS, FCC, TUV, SCM CERTIFICATES.
Beijing Silk Technology Co., Ltd / Beijing Silk Technology Co., Ltd . was found in 1998, and we are specializes in the R&D, production and sales of colorimeter, spectrophotometer, color density meter, gloss meter, color light box, color proof table, coating thickness gauge, iso test chart, etc., which is the leading producer in the color and glossy surface measurement field in China. We are also the national high technology enterprise.Till now we have received more than 20 patents and passed CE, ISO 9001, ROHS, FCC, TUV etc certifications.
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