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Quality CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation factory
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Quality CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation factory
Quality CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation factory
Quality CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation factory
Quality CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation factory
>

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation

Brand Name: Silk
Model Number: YS6080
Place of Origin: China
Certification: CE, TUV, FCC, ISO9001, RoHS
Minimum Order Quantity: 1 Unit
Price: Please send inquiry
Supply Ability: 1000 Unit per Month

Product Details


Optical Geometry: D/8 & D/0 Wavelength: 360-780nm
Repeatibility: DeltaE ≤ 0.03 Inter-instrument Error: DeltaE ≤ 0.15
Aperture: 25.4mm & 15mm & 8mm & 4mm Sphere Size: Φ154mm
Highlight

CMOS Sensors Lab Color Spectrophotometer

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Illumination Observation Lab Color Spectrophotometer

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TUV Dual Array Benchtop Spectrophotometer

Product Description

Benchtop Spectrophotometer TS8296

2021-12-29
Introduction:

The benchtop spectrophotometer TS8296 is a spectrophotometer developed by Silk using its own core technology of spectroscopy. It uses dual-array CMOS image sensors with higher sensitivity and wider spectral response range, making the test more accurate. The repeatability ΔE*ab of the TS8296 benchtop spectrophotometer is easily controlled within 0.01, and the inter-instrument agreement ΔE*ab is controlled within 0.12. The data is stable and reliable, and can be used for accurate color analysis and transmission in the laboratory.

Application of TS8296 Benchtop Spectrophotometer

The TS8296 benchtop spectrophotometer is equipped with four measuring apertures of 25.4mm, 15mm, 8mm, and 4mm, which is suitable for more samples to be tested and meets the requirements of reflective samples and transparent samples in plastic electronics, paint and ink, textile and garment printing and dyeing, printing and other industries; it can be used for fluorescent sample measurement.

 

Features of TS8296 Benchtop Spectrophotometer

1. It adopts the internationally-used D/8 structure, compatible with SCI/SCE measurement, and supports SCI+SCE rapid measurement at the same time

The TS8296 benchtop spectrophotometer adopts the internationally applicable D/8 illumination observation conditions, SCI/SCE (including specular reflection/not including specular reflection) synthesis technology, and supports SCI+SCE simultaneous rapid measurement.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 0

2. Dual array CMOS image sensor

With high sensitivity and wide spectral response range, it ensures the measurement speed, accuracy, stability and consistency of the instrument.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 1

3. Multiple color measurement spaces, multiple observation light sources

TS8296 benchtop spectrophotometer provides CIE LAB, XYZ, Yxy, LCh, CIE LUV, Musell, s-RGB, HunterLab, βxy, DIN Lab99 color space, as well as D65, A, C, D50, D55, D75, F1, F2 , F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, DLF, TL83, TL84, TPL5, U30 multiple observation light sources, which can meet the special measurement requirements under different measurement conditions.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 2

4. Adopt a combined full-spectrum LED light source and UV light source

The full-band balanced LED light source ensures sufficient spectral distribution in the visible light range, avoids the lack of spectrum of white light LEDs in specific wavelength bands, and ensures the measurement speed of the instrument and the accuracy of the measurement results. Professional UV light sources ensure UV testing more reliable.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 3

5. Metrological verification report

Each TS8296 benchtop spectrophotometer has been verified and tested, and the instrument is verified according to the measurement standards of the authoritative verification department at the factory, and the measurement data is traced to the National Institute of Metrology to ensure the authority of the instrument test data.

 

6. Automatic aperture recognition

The TS8296 benchtop spectrophotometer is equipped with four measuring apertures of Φ25.4/15/8/4mm, which can be switched at will to meet the special needs of customers.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 4

7. Industrial-grade high-definition touch screen, easy-to-use user interface

Using a 7-inch industrial-grade high-definition touch screen, the control is smooth, and the easy-to-use user interface makes the operation comfortable, convenient and easier to use.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 5

8. Color management software

The SQCX quality management software matched with the TS8296 benchtop spectrophotometer is suitable for quality monitoring and color data management in various industries. Data the user's color management, compare color differences, generate test reports, provide a variety of color space measurement data, and customize customer color management.

CMOS Sensors Lab Color Spectrophotometer TS8296 Dual Array Illumination Observation 6

Technical Parameters of TS8296 Benchtop Spectrophotometer
 

Model TS8296
Optical Geometry Reflect: di:8°, de:8°((diffuse illumination, 8°direction reception) ;
SCI (specular component included)/SCE (specular component excluded) ;Include UV/exclud UV
Transmittance: di:0°, de:0° (diffuse illumination: 0°direction reception) ;
SCI (specular component included)/SCE (specular component excluded) ; Include UV/exclud UV
Haze(ASTM D1003),
Conforms to CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724/1,ASTM E1164,DIN5033 Teil7
Application It is used for accurate analysis and transmission of laboratory color.
Used for color transfer and quality control of reflective samples and transparent samples in plastic electronics, paint and ink, textile and garment printing and dyeing, printing and other industries.
Integrating Sphere Size Φ154mm
Light Source 360 nm to 780 nm, Combined LED Light, 400nm cut-off light source,420nm cut-off light source
Spectrophotometric Mode Concave Grating
Sensor 256 Image Element Double Array CMOS Image Sensor
Wavelength Range 360-780nm
Wavelength Interval 10nm
Semiband Width 10nm
Measured Reflectance Range 0-200%
Measuring Aperture Reflective : Φ30mm/Φ25.4mm, Φ18mm/Φ15mm, Φ10mm/Φ8mm, Φ6mm/Φ4mm;
Transmissive : Φ25.4mm, Φ4mm
Remark:
1. Automatic identification of switch aperture
2.Customers can configure the aperture and lens position according to their needs
Specular Component Reflectance: SCI/SCE, Transmittance: SCI&SCE
Color Space CIE LAB,XYZ,Yxy,LCh,CIE LUV,Musell,s-RGB,HunterLab,βxy,DIN Lab99
Color Difference Formula ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00, DINΔE99,ΔE(Hunter)
Other Colorimetric Index WI (ASTM E313, CIE/ISO, AATCC, Hunter),
YI (ASTM D1925, ASTM 313),
Metamerism index Mt,
Staining Fastness, Color Fastness, Color Strength, Opacity,
APHA/Hazen/Pt-Co (Platinum Cobalt Index), Gardner Index
8° gloss, 555 color classification, haze (ASTM D1003), Saybolt (Sybert index), ASTM D1500 color scale, Chinese Pharmacopoeia color scale
Observer Angle 2°/10°
Illuminant D65,A,C,D50,D55,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,DLF,TL83,TL84,TPL5,U30
Displayed Data Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Offset
Measuring Time About 2.4s (Measure SCI & SCE about 5s)
Repeatability Spectral reflectance: Φ25.4mm/SCI, Standard deviation within 0.04%
Chromaticity value:Φ25.4mm/SCI, Standard deviation within ΔE*ab 0.01 (After the instrument is warmed up and calibrated, measure the average value of the whiteboard 30 times at an interval of 5s)
Spectral transmittance: Φ25.4mm/SCI, Standard deviation within 0.05%
Chromaticity value:Φ25.4mm/SCI, Standard deviation within ΔE*ab 0.02(After the instrument is warmed up and calibrated, measure the average value of the whiteboard 30 times at an interval of 5s)
Inter-instrument Error Φ25.4mm/SCI, Within ΔE*ab 0.12(Measured average value of 12 tiles of BCRA series Ⅱ)
Dimension L*W*H=370x300x200mm
Weight Approx. 9.6kg
Power AC 24V, 3A Power adapter power supply
Illuminant Life Span 5 years, more than 3 million times measurements
Display 7-inch TFT color LCD, Capacitive Touch Screen
Data Port USB, Bluetooth®5.0, print serial port
Data Storage Standard 5000 Pcs, Sample 40000 Pcs(SCI/SCE counts as one piece of data)
Language Simplified Chinese, Traditional Chinese, English, (German, French, Spanish can be customized)
Operating Environment 0~40℃(32~104°F)
Storage Environment -20~50℃(-4~122°F)
Standard Accessory Power adapter, manual, quality management software (download from official website), data cable, standard calibration board, black calibration box, transmission black baffle, sample holder, 25.4mm aperture, 15mm aperture, 8mm aperture, 4mm aperture, transmission test fixture assembly , Micro-hole (4mm) transmission test fixture assembly
Optional Accessory Mini printer, instrument upside down test fixture, petri dish
Notes The specifications are subject to change without notice.

Product Highlights

Benchtop Spectrophotometer TS8296 39 2021-12-29 Introduction: The benchtop spectrophotometer TS8296 is a spectrophotometer developed by Silk using its own core technology of spectroscopy. It uses dual-array CMOS image sensors with higher sensitivity and wider spectral response range, making the test ...

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